| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5355912 | Applied Surface Science | 2012 | 5 Pages |
Abstract
⺠Microstructure of GeSbTe thin films was characterized by XRD and AFM. ⺠Annealing and applying electrical field can induce crystallization on thin film. ⺠Conductive-AFM was used to modify the surface of GeSbTe thin film.
Related Topics
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Physical and Theoretical Chemistry
Authors
Fei Yang, Ling Xu, Rui Zhang, Lei Geng, Liang Tong, Jun Xu, Weining Su, Yao Yu, Zhongyuan Ma, Kunji Chen,