| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5355976 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠Evaporated Fe thin films in the 76-431 nm thickness range. ⺠The surface morphology, the structural and electrical properties are investigated. ⺠The effect of substrate (glass, Si), deposition rate and thickness are studied. ⺠Texture, grain size, strain and electrical resistivity depend on the substrate. ⺠Higher deposition rate induces droplets on the surface with greater density in Fe/Si.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Mebarki, A. Layadi, A. Guittoum, A. Benabbas, B. Ghebouli, M. Saad, N. Menni,