Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5356151 | Applied Surface Science | 2012 | 4 Pages |
Abstract
⺠Thickness profiles of BaxSr1âxTiO3 thin films were measured. ⺠Comparison between pulsed laser (PLD) and pulsed electron beam deposition (PED). ⺠The film thicknesses profile of PED has a slightly broader shape than that of PLD. ⺠The film stoichiometry is preserved at all angles.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Nistor, F. Gherendi, N.B. Mandache,