Article ID Journal Published Year Pages File Type
5356151 Applied Surface Science 2012 4 Pages PDF
Abstract
► Thickness profiles of BaxSr1−xTiO3 thin films were measured. ► Comparison between pulsed laser (PLD) and pulsed electron beam deposition (PED). ► The film thicknesses profile of PED has a slightly broader shape than that of PLD. ► The film stoichiometry is preserved at all angles.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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