Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5356325 | Applied Surface Science | 2014 | 5 Pages |
Abstract
In the present work, we investigate the formation of nano tracks by cluster and mono-atomic ion beams in the fullerene (C60) thin films by High Resolution Transmission Electron Microscopy (HRTEM). The fullerene films on carbon coated grids were irradiated by 30Â MeV C60 cluster beam and 120Â MeV Au mono-atomic beams at normal and grazing angle to the incident ion beams. The studies show that the cluster beam creates latent tracks of an average diameter of around 20Â nm. The formation of large size nano tracks by cluster beam is attributed to the deposition of large electronic energy density as compared to mono-atomic beams.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. Kumar, D.K. Avasthi, J. Ghatak, P.V. Satyam, R. Prakash, A. Kumar,