| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5356883 | Applied Surface Science | 2011 | 7 Pages |
Abstract
ⶠBy a refined calculation procedure and with the evaluated partial molar volumes of the surfactant and the solvent, the molar concentration-depth profiles of surfactant ions have been reconstructed by angle resolved photoelectron spectroscopy. ⶠThe anionic molar concentration-depth profiles and surface excesses have good agreements with their counterparts determined by neutral impact ion scattering spectroscopy.
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Authors
Chuangye Wang, Harald Morgner,