Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5357081 | Applied Surface Science | 2012 | 5 Pages |
Abstract
⺠The ramping rate of sulfurization of CZTS precursors with high Sn content has been studied. ⺠Fast ramping at 21 °C/min resulted in the degraded CZTS films after sulfurization with a bubble-like surface. ⺠Slow ramping at 2 °C/min can remove the excessive Sn in the films and elevate the crystalline quality of CZTS films.
Related Topics
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Authors
Jie Ge, Yunhua Wu, Chuanjun Zhang, Shaohua Zuo, Jinchun Jiang, Jianhua Ma, Pingxiong Yang, Junhao Chu,