Article ID Journal Published Year Pages File Type
5357087 Applied Surface Science 2012 7 Pages PDF
Abstract
► Thermal certification campaigns on charge state conversion surfaces were performed. ► Ion scattering and AFM instruments were used to characterize surface properties. ► AFM images showed no significant changes in surface roughness. ► Ion scattering instrument was sensitive enough to measure changes on sub atomic level.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
On the surface characterization of an Al2O3 charge state conversion surface using ion scattering and atomic force microscope measurements
Authors
, , , , ,