Article ID Journal Published Year Pages File Type
5357410 Applied Surface Science 2012 5 Pages PDF
Abstract
► Storing Matter is a novel technique that can improve the sensitivity during SIMS analysis. ► The influence of the oxidation of a Si collector on the secondary ion yields of In and Au deposits is analyzed. ► Surfaces with very different levels of oxidation led to modified secondary ions yields. ► The oxidation generated on a Si0 collector under vacuum is not enough to induce relevant changes.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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