Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5357538 | Applied Surface Science | 2015 | 5 Pages |
Abstract
There was a significant difference in the CMP performance of 6H-SiC between silica and ceria based slurries. For the ceria based slurries, a higher MRR was obtained, especially in strong acid KMnO4 environment.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Guomei Chen, Zifeng Ni, Laijun Xu, Qingzhong Li, Yongwu Zhao,