Article ID Journal Published Year Pages File Type
5358283 Applied Surface Science 2015 8 Pages PDF
Abstract
Several crystalline copper sulfide phases (spionkopite, anilite, digenite, djurleite, chalcocite) were obtained in as synthesized samples (PE-CuxS) and elucidated using XRD. Thickness of the films obtained ranged from several microns to ∼18 μm and depended on the Cu(II/I) exposure time. Bandgap of the materials obtained was measured and ranged from 1.88 to 1.17 eV. Importantly, heating samples, many copper sulfide crystalline phase containing films at 100 °C in inert atmosphere invariably resulted in a single copper sulfide, anilite (Cu1.75S), phase.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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