Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5358456 | Applied Surface Science | 2010 | 9 Pages |
Abstract
The physical, chemical, electrical and optical properties of as-deposited and annealed CdIn2O4 thin films deposited using spray pyrolysis technique at different nozzle-to-substrate distances are reported. These films are characterized by X-ray diffraction, XPS, SEM, PL, Hall effect measurement techniques and optical absorption studies. The average film thickness lies within 600-800 nm range. The X-ray diffraction study shows that films exhibit cubic structure with orientation along (3 1 1) plane. The XPS study reveals that CdIn2O4 films are oxygen deficient. Room temperature PL indicates the presence of green shift with oxygen vacancies. The typical films show very smooth morphology. The best films deposited with optimum nozzle-to-substrate distance (NSD) of 30 cm, has minimum resistivity of 1.3 Ã 10â3 Ω cm and 2.6 Ã 10â4 Ωâ1 figure of merit. The band gap energy varies from 3.04 to 3.2 eV with change in NSD for annealed films. The effect of NSD as well as the annealing treatment resulted into the improvement of the structural, electrical and optical properties of the studied CdIn2O4 thin films.
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Authors
R.J. Deokate, A.V. Moholkar, G.L. Agawane, S.M. Pawar, J.H. Kim, K.Y. Rajpure,