Article ID Journal Published Year Pages File Type
5358564 Applied Surface Science 2015 4 Pages PDF
Abstract
In this paper we present recent work on the optoelectronic characterization of the PINPIN structure to be incorporated in the X-ray image sensor. The results from the optoelectronic characterization of the device and the dependence on scanning beam parameters are presented and discussed. Preliminary results of line scans are also presented.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
PINPIN a-Si:H based structures for X-ray image detection using the laser scanning technique
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