| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5358619 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠Composition depth profiles of the BNT film are studied by XPS. ⺠Chemical compositions are divided into three regions along the film depth. ⺠Compositions are uniform in the bulk film. ⺠Ar+-ion sputtering changes lots of Bi3+ ions into Bi0.
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Physical and Theoretical Chemistry
Authors
Z.H. Zhang, X.L. Zhong, H. Liao, F. Wang, J.B. Wang, Y.C. Zhou,