| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5358628 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠Atomic force microscopy and transmission electron microscopy (TEM) images showed that the surfaces of the ZnO thin films annealed in a nitrogen atmosphere became very rough in contrast to those annealed in an oxygen atmosphere. ⺠High-resolution TEM images showed that many stacking faults and tilted grains could be observed in the ZnO thin films annealed in a nitrogen atmosphere in contrast to those annealed in an oxygen atmosphere.
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Authors
J.W. Shin, Y.S. No, J.Y. Lee, J.Y. Kim, W.K. Choi, T.W. Kim,