| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5358690 | Applied Surface Science | 2011 | 7 Pages |
Abstract
⺠The lowest resistivity of 8.4 Ã 10â5 Ωcm was obtained at annealed buffered substrate. ⺠The characteristic of c-axis oriented texture grows up at different substrates. ⺠Two kinds of stacking faults were observed at Fourier filtered images. ⺠Origin and consequences of stacking faults were discussed. ⺠Lower defect density of film has a benefit effect on the resistivity.
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Authors
Zhiyun Zhang, Chonggao Bao, Shengqiang Ma, Shuzeng Hou,