Article ID Journal Published Year Pages File Type
5358873 Applied Surface Science 2011 5 Pages PDF
Abstract
▶ Large dielectric constants of the films are obtained within range of 800-1600 which are almost comparable to those observed in bulk ceramics. ▶ Low lanthanum substitution contributes to higher electric properties of the films due to the improvement of non-180° domain wall mobility as well as the stabilization of tetragonal phase.
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Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Enhanced dielectric and ferroelectric properties of Pb1−3x/2Lax(Zr0.5Ti0.5)O3 thin films with low lanthanum substitution
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