Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5359161 | Applied Surface Science | 2009 | 4 Pages |
Abstract
We report on room temperature MeV Au ion induced modifications at the Co/Si interfaces. Nanometers size thin film of Co and Si were grown by ultra high vacuum (UHV) electron beam evaporation technique on Si(1 1 1) surface and were irradiated by 1.5 MeV Au2+ ions at a fluence of 5 Ã 1014 ions cmâ2. High-resolution transmission electron microscopy (HRTEM) along with energy filter imaging technique has been employed to study the formation of Co-Si alloy at the interface. Formation of such surface alloy has been discussed in the light of ion-matter interaction in nanometer scale regime.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
J. Ghatak, D. Kabiraj, P.V. Satyam,