| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5359185 | Applied Surface Science | 2014 | 4 Pages |
Abstract
Powdered samples of Cu2ZnSnS4 derivatives prepared through a solid-state route were investigated by both bulk (electron dispersive X-ray spectroscopy) and surface-sensitive (X-ray photoelectron spectroscopy) methods. We observe a deviation in composition between the surface and the bulk for all non-stoichiometric samples (both Cu-poor and Cu-rich). This behavior has already been observed for slightly Cu-poor CZTS thin films and is reminiscent of that of CIGSe compounds.
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Authors
S. Harel, C. Guillot-Deudon, L. Choubrac, J. Hamon, A. Lafond,