| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5359527 | Applied Surface Science | 2010 | 6 Pages |
Abstract
Thermal structural changes of TiOx films built on a Si(0Â 0Â 1) surface were investigated at the nanometer scale with scanning tunneling microscopy. Electronic properties of individual clusters were classified by means of scanning tunneling spectroscopy. The differential conductance (dI/dV) near the Fermi energy showed that nano-clusters were transformed from semiconducting Ti-silicates into metallic Ti-silicides after heating to 970Â K. Peaks of normalized differential conductance (dI/dV/(I/V)) of the clusters shifted after heating to about 1070Â K, indicating exclusion of oxygen from the clusters.
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Physical and Theoretical Chemistry
Authors
T. Aoki, K. Shudo, K. Sato, S. Ohno, M. Tanaka,