Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5359784 | Applied Surface Science | 2009 | 4 Pages |
Positron lifetime of ZnO-based scintillating glasses (55 â x)SiO2-45ZnO-xBaF2 (x = 5, 10, 15 mol%) were measured with a conventional fast-fast spectrometer. Three positron lifetime components Ï1, Ï2, and Ï3 are â¼0.23 ns, â¼0.45 ns, and â¼1.6 ns, respectively. All the three positron lifetime components first increase with increasing BaF2 concentration from 5 mol% to 10 mol%, then decreases as BaF2 further increases to 15 mol%. The result suggests that the glass sample with 10 mol% BaF2 contains the highest defect density, and is in excellent agreement with glass chemistry, glass density, thermal properties, and calculated crystallinity. Therefore, positron annihilation lifetime measurement is an effective tool for analyzing defects in ZnO-based scintillating glasses.