Article ID Journal Published Year Pages File Type
5360258 Applied Surface Science 2013 5 Pages PDF
Abstract
► FE methodology is a development for the critical thickness variation in finite epitaxial systems. ► The reasons as to why interfacial dislocations cannot 'punch-in' directly from the free lateral surface are addressed. ► The region close to the free lateral surface, where critical thickness value diverges is determined.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Position dependant critical thickness in finite epitaxial systems
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