Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5360388 | Applied Surface Science | 2013 | 5 Pages |
Abstract
⺠Proton-irradiated 4H-SiC was probed by micro-Raman scattering spectroscopy. ⺠The changes of the line-shape and peak position in LOPC mode were analyzed. ⺠The estimated penetration depths from 6 to 8 MeV energy protons were 180 and 300 μm, respectively.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Hong-Yeol Kim, Jihyun Kim, Jaime A. Jr,