Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5360431 | Applied Surface Science | 2013 | 9 Pages |
Abstract
⺠Y3(Al,Ga)5O12:Tb thin films were grown on Si(1 0 0) substrates. ⺠Y3(Al,Ga)5O12:Tb thin film was converted to Y2Si2O7:Tb due to Si interdiffusion at high temperature annealing. ⺠The presence of different types of traps resulting from the change on the structure of the thin films was monitored with thermoluminescence. ⺠The excitation and the emission bands changed due to new compound formation.
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Authors
A. Yousif, H.C. Swart, O.M. Ntwaeaborwa, E. Coetsee,