Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5360715 | Applied Surface Science | 2008 | 4 Pages |
Abstract
2 Ï steradian Si 2p photoelectron pattern from Si(0Â 0Â 1) surface was measured. The circular dichroism of rotational shift around the incident-light axis was observed. Shifts for the forward focusing peaks in {111} and {011} directions were inversely proportional to the distance between the emitter atom and neighboring atoms in {111} and {011} directions, respectively. These shifts correspond to the parallax in stereograph of the atomic arrangements. On the other hand, such rotational shifts were not observed in {112} directions due to the first order diffraction rings around {110} directions. A gross feature of Si 2p photoelectron pattern can be explained by forward focusing peaks and first order diffraction rings around them.
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Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Kanako Inaji, Fumihiko Matsui, Yukako Kato, Chikako Sakai, Takashi Narikawa, Tomohiro Matsushita, Fang Zhun Guo, Hiroshi Daimon,