Article ID Journal Published Year Pages File Type
5360715 Applied Surface Science 2008 4 Pages PDF
Abstract
2 π steradian Si 2p photoelectron pattern from Si(0 0 1) surface was measured. The circular dichroism of rotational shift around the incident-light axis was observed. Shifts for the forward focusing peaks in {111} and {011} directions were inversely proportional to the distance between the emitter atom and neighboring atoms in {111} and {011} directions, respectively. These shifts correspond to the parallax in stereograph of the atomic arrangements. On the other hand, such rotational shifts were not observed in {112} directions due to the first order diffraction rings around {110} directions. A gross feature of Si 2p photoelectron pattern can be explained by forward focusing peaks and first order diffraction rings around them.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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