| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5360772 | Applied Surface Science | 2008 | 4 Pages |
Abstract
The structure of buried Si(1Â 1Â 1)-5Â ÃÂ 2-Au capped with amorphous Si was investigated using surface X-ray diffraction. It was found that the 5Â ÃÂ 2 structural periodicity is kept under the amorphous Si from the in-plane measurement. Furthermore, the intensity variation along the fractional-order rod indicates that Au atoms are located almost on the same plane.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yusaku Iwasawa, Wolfgang Voegeli, Tetsuroh Shirasawa, Kouji Sekiguchi, Takehiro Nojima, Ryuji Yoshida, Toshio Takahashi, Masuaki Matsumoto, Tatsuo Okano, Koichi Akimoto, Hiroshi Kawata, Hiroshi Sugiyama,