Article ID Journal Published Year Pages File Type
5361045 Applied Surface Science 2014 33 Pages PDF
Abstract

- Novel Lu2WO6:Eu3+ luminescence films with micron-thickness were first fabricated on Si (1 0 0) wafer by a chemical route.
- Lu2WO6:Eu3+ films with dense and homogeneous morphology exhibit good scintillation properties.
- Luminescence mechanism associated with Eu3+ site occupation and possible energy transfer of Lu2WO6:Eu3+ films have also been proposed.
- A new method of hydrophilizing Si (1 0 0) wafers without HF is proposed.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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