| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5361089 | Applied Surface Science | 2008 | 5 Pages |
Abstract
The present work focuses on the use of IR spectroscopy and photoluminescence spectral measurements for studying the treatment temperature effect on the compositional and luminescent properties of oxalic acid alumina films. In line with the recent researches we have also found that heat treatment of porous alumina films formed in oxalic acid leads to considerable changes in their photoluminescence properties: upon annealing the intensity of photoluminescence (PL) increases reaching a maximum at the temperature of around 500 °C and then decreases. IR spectra of as-grown and heat-treated films have proved that PL emission in the anodic alumina films is related with the state of 'structural' oxalate species incorporated in the oxide lattice. These results allowed us to conclude that PL behavior of oxalic acid alumina films can be explained through the concept of variations in the bonding molecular orbitals of incorporated oxalate species including Ï- and Ï-bonds.
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Authors
I. Vrublevsky, A. Jagminas, S. Hemeltjen, W.A. Goedel,