| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5361179 | Applied Surface Science | 2009 | 5 Pages |
Abstract
In this work, we report on the structural characterisation of Ni and Ni/Ti bilayer contacts on n-type 4H-SiC. The redistribution of carbon, after annealing, in the Ni/SiC and the Ni/Ti/SiC contacts is particularly studied by RBS at 3.2Â MeV, XRD and AES techniques.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Siad, C. Pineda Vargas, M. Nkosi, D. Saidi, N. Souami, N. Daas, A.C. Chami,