| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5361292 | Applied Surface Science | 2012 | 7 Pages |
Abstract
⺠Sputter deposition of ITO has been performed on top of the organic semiconductor (ZnPc). ⺠Interface formation was investigated by in situ XPS. ⺠No chemical reaction at the interface, i.e. no sputter damage, is observed. ⺠The barrier height for hole injection (0.9 eV) does not depend on the deposition sequence of the layers. ⺠Sputtered ITO layers should be feasible as top electrodes for inverted, stacked and fully transparent OLEDs.
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Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Jürgen Gassmann, Joachim Brötz, Andreas Klein,