| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5361504 | Applied Surface Science | 2012 | 6 Pages |
Abstract
⺠Microstructure and crystallographic aspects of ZnO:Al thin films were investigated by EBSD. ⺠Both top surface and cross-section analysis were performed. ⺠Strong texture on the basal plane orientation was observed on the analyzed thin film surface. ⺠A strong prismatic texture was found in cross-section analysis.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
C.B. Garcia, E. Ariza, C.J. Tavares, P. Villechaise,