| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5361531 | Applied Surface Science | 2008 | 4 Pages |
Abstract
La-substituted BiFeO3, Bi0.8La0.2FeO3, thin films were fabricated on Pt/Ti/SiO2/Si substrates by pulsed laser deposition. X-ray diffraction and high-resolution transmission electron microscope were used to analyze the structures of the films. The results show the films fabricated under optimized growth condition are (0 1 2) textured. X-ray photoemission spectroscopy results indicate that the oxidation state of Fe ion is Fe3+ in the films without detectable Fe2+. The films show low leakage current and excellent dielectric characters. Multiferroic properties with a remnant ferroelectric polarization of 5.2 μC/cm2 and a remanent magnetization of 0.02 μB/Fe were established. These results have some implications for further research.
Keywords
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yi Zhang, Ling-Hua Pang, Ming-Hui Lu, Zheng-Bin Gu, Shan-Tao Zhang, Chang-Sheng Yuan, Yan-Feng Chen,