Article ID Journal Published Year Pages File Type
5362091 Applied Surface Science 2012 4 Pages PDF
Abstract
► Structural characterisation of Ni and Ni/Ti contacts on n-type 4HSiC. ► Role of carbon in the Ni and Ni/Ti contacts on n-type 4HSiC. ► Raman spectroscopy (RS), X-ray diffraction (XRD) and Auger electron spectroscopy (AES).
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Role of carbon in the formation of ohmic contact in Ni/4HSiC and Ni/Ti/4HSiC
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