Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5362174 | Applied Surface Science | 2012 | 6 Pages |
Abstract
⺠NbN thin films were successfully deposited on Si(1 0 0) by pulsed laser deposition (PLD) in nitrogen background. ⺠Structural and mechanical properties of NbN thin films were investigated using X-ray diffraction, atomic force microscopy, and nanoindentation. ⺠NbN films reveal simple cubic δ-NbN structure with the corresponding reflections of (1 1 1), (2 0 0), and (2 2 0) planes. ⺠The average modulus of the film is 420 ± 60 GPa. ⺠The hardness of the film increases monotonically from an average of 12 GPa for deep indents (Si substrate) to an average of 25 GPa.
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Authors
M.A. Mamun, A.H. Farha, A.O. Er, Y. Ufuktepe, D. Gu, H.E. Elsayed-Ali, A.A. Elmustafa,