Article ID Journal Published Year Pages File Type
5362174 Applied Surface Science 2012 6 Pages PDF
Abstract
► NbN thin films were successfully deposited on Si(1 0 0) by pulsed laser deposition (PLD) in nitrogen background. ► Structural and mechanical properties of NbN thin films were investigated using X-ray diffraction, atomic force microscopy, and nanoindentation. ► NbN films reveal simple cubic δ-NbN structure with the corresponding reflections of (1 1 1), (2 0 0), and (2 2 0) planes. ► The average modulus of the film is 420 ± 60 GPa. ► The hardness of the film increases monotonically from an average of 12 GPa for deep indents (Si substrate) to an average of 25 GPa.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
, , , , , , ,