Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5362345 | Applied Surface Science | 2010 | 4 Pages |
Abstract
A phase-separated structure of the active layer, of variable thickness, buried in organic thin film solar cells (OTSC) was directly observed by scanning force microscopy (SFM) with the aid of a surface and interface cutting analysis system (SAICAS). This deals with SFM observation to both the surface and the internal regions of the OTSCs, leading to discussion about the formation of the overlayer in the active layer.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Ifu Narayama, Daisuke Baba, Atsushi Takahara, Keiji Tanaka,