Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5362354 | Applied Surface Science | 2008 | 4 Pages |
Abstract
Ba(ZrxTi1âx)O3 (BZT) (x = 0.20 and 0.30) thin films are deposited on Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrate by sol-gel method. X-ray diffraction patterns show that the thin films have a good crystallinity. Optical properties of the films in the wavelength range of 2.5-12 μm are studied by infrared spectroscopic ellipsometry (IRSE). The optical constants of the BZT thin films are determined by fitting the IRSE data using a classical dispersion formula. As the wavelength increases, the refractive index decreases, while the extinction coefficients increase. The effective static ionic charges are derived, which are smaller than that in a purely ionic material for the BZT thin films.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Aiyun Liu, Jianqiang Xue, Xiangjian Meng, Jinglan Sun, Zhiming Huang, Junhao Chu,