Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5362714 | Applied Surface Science | 2012 | 5 Pages |
Abstract
- Ripple is observed on Ti irradiated with focused ion beam even at normal incidence.
- Ripple orientation is progressively influenced by the ion beam direction with incidence angle increasing.
- The morphological evolution from the well-developed straight ripples to the curved ones is observed.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
H.X. Qian, W. Zhou,