Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5362803 | Applied Surface Science | 2009 | 4 Pages |
Two to ten nanometer thick polycrystalline Pd films were prepared on the (1 1 1) surface of Ag single crystal and investigations of the Ag diffusion along Pd grain boundaries were carried out using the Hwang-Balluffi method. The samples were monitored by Auger electron spectroscopy (AES) during isothermal heat treatments in the 438-563 K temperature range. Using plausible simplifying assumptions, the activation energy of the product of the grain boundary (GB) diffusion coefficient and kâ² (kâ²Â = cs/cgb; cs and cgb are the surface and GB concentration, respectively) was calculated (0.99 ± 0.08 eV) from the evaluated saturation coefficients of the surface accumulation. This energy, for weak temperature dependence of kâ², is approximately equal to the activation energy of the GB diffusion.