| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5362911 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠A new method aims to measure elongation rate of thin films with nano-level thickness. ⺠The method made use of a simple chemical reaction as follows: AgOxâ¶160oCAg+x2O2. ⺠The parameters of the microbumps could be controlled by adjusting laser energy. ⺠Residual stress, Young's modulus, and Poisson's ratio, could be studied in next work.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Aihuan Dun, Jingsong Wei, Fuxi Gan,