| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5363103 | Applied Surface Science | 2013 | 8 Pages |
Abstract
⺠FE simulation of nitriding is proposed, using the analogy between diffusion and conduction. ⺠Nitrided layer was characterized by OM, SEM observation, micro-hardness and XRD measurements. ⺠Diffusion zone is constituted by two different microstructures. ⺠Different residual stress and FWHM trends were found in the two parts of diffusion zone. ⺠Geometry dependency of layers growth and formation is captured by developed FE model.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
S.M. Hassani-Gangaraj, M. Guagliano,