Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5363228 | Applied Surface Science | 2008 | 4 Pages |
Abstract
Ba0.5Sr0.5TiO3/Bi1.5Zn1.0Nb1.5O7 (BST/BZN) multilayer thin films were prepared on Pt/Al2O3 substrates by sol-gel method. The structure, morphology, and tunable dielectric properties of BST/BZN thin films were investigated. X-ray diffraction results showed that the structure of BST/BZN multilayer thin films was composed of a cubic BZN pyrochlore phase and a cubic BST perovskite phase. The diffraction pattern confirmed that there was no measurable reaction occurred between the BST and BZN layers. The field-emission scanning electron microscope (FESEM) showed that the surface of BST/BZN multilayer thin films was crack-free and compact. The dielectric constant and loss tangent of the BST/BZN multilayer thin films were 106 and 0.011 at 10Â kHz, respectively. The dielectric tunability was 10% under dc bias field of 355Â kV/cm at 10Â kHz. The medium dielectric constant, low loss tangent and tunability of the dielectric constant suggest that BST/BZN multilayer thin films have potential application for tunable microwave device applications.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Xin Yan, Wei Ren, Peng Shi, Xiaoqing Wu, Xiaofeng Chen, Xi Yao,