| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5363380 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠It presents a systematic study of PL emission of Si nanocrystals from Si/SiO multilayered structures. ⺠The result shows that the PL intensity is determined by both the amount of doping of Si and the distribution of Si as well. ⺠Also it shows that the PL intensity of Si nanocrystals from the multilayered structure can be significantly greater than the sample prepared by co-evaporation of Si and SiO at the same optimized Si to O ratio.
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Authors
Yong Ren, Yong-Bin Chen, Miao Zhang, Jiang Zhu, Xing-Wang Zhang, You-Yuan Zhao, Ming Lu,