Article ID Journal Published Year Pages File Type
5363556 Applied Surface Science 2008 4 Pages PDF
Abstract
Surprisingly, some of those MCs2+ clusters were still detected even after a very long sputtering fluence (above 1017 ions/cm2), proving that some molecular depth profiling is also possible in this “Cs2-cationisation” mode. In other words, this work could open the way to an extension of the MCsn+ cluster analysis, commonly used in inorganic depth profiling, to the in-depth molecular analysis of organic layers.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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