Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5363556 | Applied Surface Science | 2008 | 4 Pages |
Abstract
Surprisingly, some of those MCs2+ clusters were still detected even after a very long sputtering fluence (above 1017Â ions/cm2), proving that some molecular depth profiling is also possible in this “Cs2-cationisation” mode. In other words, this work could open the way to an extension of the MCsn+ cluster analysis, commonly used in inorganic depth profiling, to the in-depth molecular analysis of organic layers.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
N. Mine, B. Douhard, L. Houssiau,