Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5363676 | Applied Surface Science | 2011 | 6 Pages |
Abstract
⺠Near normal incidence ion erosion of Si results in two mode ripples. ⺠Ripples perpendicular to ion beam direction are inherently related to Fe addition. ⺠Ripples parallel to ion beam are less affected by Fe incorporation. ⺠Ripples parallel to ion beam become dominant at low ion energy (â¤500 eV).
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Marina Cornejo, Bashkim Ziberi, Christoph Meinecke, Frank Frost,