| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5363690 | Applied Surface Science | 2011 | 5 Pages |
High resolution X-ray diffraction (HRXRD), Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM) techniques were used to characterize the surface of CdZnTe (CZT) samples treated by mechanical lapping, polishing and chemical etching processes. The results confirm that the etching process produces the highest intensity diffraction peak, and the best full-width-at-half-maximum (FWHM). Fourier Transform Infrared (FTIR) spectroscopy shows that fine polishing increases the infrared transmission of the CZT sample, while etching with 2% bromine methanol (BM) etching decreases the infrared transmission. Different etchants and concentrations were investigated by comparing the surface morphology and roughness. The bromine methanol etching has shown more flat surface with lower roughness than the other etchants.
Graphical abstractDownload full-size imageHighlights⺠Bromine methanol etching shows the highest crystalline quality. ⺠Fine mechanical polishing increases infrared transmission. ⺠Bromine methanol etching decreases the infrared transmission. ⺠Low concentration of bromine methanol etching provides pitting effect. ⺠High concentration of bromine methanol etching displays waving effect.
