| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5364209 | Applied Surface Science | 2012 | 5 Pages |
Abstract
⺠We investigated the morphology of CeO2 cap layers influence by substrate temperature and deposition rate. ⺠AFM exhibited the grain shape grown from granule to cluster with the temperature increasing, the grain size decreased as the sputter power increased, and their mechanisms were proposed. ⺠The root mean square surface roughness of the best sample was 1.8 nm over a 3 μm Ã 3 μm area. ⺠The YBCO layer with thickness of 1.36 μm exhibited a Jc of 1.72 MA/cm2 at 77 K.
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Authors
Yudong Xia, Jie Xiong, Fei Zhang, Yan Xue, Lili Wang, Pei Guo, Pengju Xu, Xiaohui Zhao, Bowan Tao,