| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5364252 | Applied Surface Science | 2008 | 4 Pages |
Abstract
The Atomic Force Microscope (AFM) with the conducting cantilever has been used as a tool for controlled printing the well-defined shapes of conductive paths on the 6H-SiC(0Â 0Â 0Â 1) surface as well as paths connecting the shapes. For clean 6H-SiC(0Â 0Â 0Â 1) samples the metal-tip/sample contact is of the diode type. The conditions have been found (tip/sample voltage, current) for which the local morphology of the surface is modified during current flow between the tip and the sample. Such a modified surface shows quite a different conduction type of the tip/sample surface contact than that of the unmodified surface.
Keywords
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. Mazur, M. Grodzicki, S. Zuber, A. Ciszewski,