Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5364307 | Applied Surface Science | 2007 | 6 Pages |
Abstract
A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10Â h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.
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Authors
Young-Hyun Shin, Jin-Won Song, Eung-Sug Lee, Chang-Soo Han,