| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5364381 | Applied Surface Science | 2011 | 4 Pages |
Abstract
ⶠGISAXS and AFM are compared to study the morphology of GaAs nanostructures deposited by PLD. ⶠthe results of two techniques are in good agreement, despite the different resolutions. ⶠnanoparticle size and size distribution is controlled by the number of pulses applied.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. DubÄek, B. Pivac, S. MiloÅ¡eviÄ, N. KrstuloviÄ, Z. Kregar, S. Bernstorff,