| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5364528 | Applied Surface Science | 2012 | 5 Pages |
The impact of prolonged X-ray irradiation during X-ray photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It was observed that prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase. Fourier transform infrared spectroscopy (FT-IR) data indicate that the ferroelectric phase diminishes completely after 360Â kJ of X-ray irradiation dose and it induces the paraelectric phase. In this work, the main emphasis was given to the optimization of the X-ray irradiation dose during XPS measurements to maintain the ferroelectric phase within the copolymer films.
⺠XPS is a very sensitive tool for investigating the surface properties of P(VDF-TrFE) thin films. ⺠Prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase which leads to paraelectric phase, whereas ferroelectric phase is the main focus of interest. ⺠X-ray irradiation dose during XPS measurement was optimized. ⺠Ferroelectrc phase to Paraelectric phase transformation was confirmed by FT-IR Spectroscopy. ⺠NEXAFS was undertaken to check the degradation phenomena.
