Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5364857 | Applied Surface Science | 2009 | 7 Pages |
We study the structural properties of the surface roughness, the surface mound size and the interfacial structure in Ni thin films vacuum-deposited on polyethylene naphthalate (PEN) organic substrates with and without the application of magnetic field and discuss its feasibility of fabricating quantum cross (QC) devices. For Ni/PEN evaporated without the magnetic field, the surface roughness decreases from 1.3Â nm to 0.69Â nm and the surface mound size increases from 32Â nm to 80Â nm with the thickness increased to 41Â nm. In contrast, for Ni/PEN evaporated in the magnetic field of 360Â Oe, the surface roughness tends to slightly decrease from 1.3Â nm to 1.1Â nm and the surface mound size shows the almost constant value of 28-30Â nm with the thickness increased to 35Â nm. It can be also confirmed for each sample that there is no diffusion of Ni into the PEN layer, resulting in clear Ni/PEN interface and smooth Ni surface. Therefore, these experimental results indicate that Ni/PEN films can be expected as metal/insulator hybrid materials in QC devices, leading to novel high-density memory devices.